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Sapphire wafer thickness sorting machine (Model WTS-05)

This is a device that measures the thickness of sapphire wafers and sorts them according to their thickness.

By sorting, we prevent wafers with abnormal thickness from flowing into the next process. By measuring the thickness before and after wafer processing, we can also manage the processing conditions. Additionally, by standardizing the thickness for each cassette, the processing quality in the next step is improved.

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment

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